The DP4000-M series portable cable harness tester can bewidely used for on-site analysis and testing of various wire harnesses andcables. The distributed type can be used for distributed on-site testing ofcable harnesses in industries such as aerospace, rail transit, and marine.Integrated with:
1.Hybridtwo/four-wire testing
2.RapidOS (Open-Short) testing
3.four-wireresistance testing
4.DCRtesting
5.Insulationresistance testing
6.DChipot testing
7.Diode/ZenerDiode testing
8.NTC/PTCtesting
9.Maxiumtest points: 512
1.Optimized for portabletesting scenarios
2.Hybridtwo/four-wire testing method maximizes test point utilization efficiency
3.Distributedarchitecture supports expansion beyond 20,000 points
4.Card-basedmodule design for easy expansion
5.Continuityresistance testing with a minimum resolution of 100μΩ~1GΩ
6.Programmablehigh-voltage power supply：0~1000V DC
7.ESDcomponent testing with 1mA constant current excitation
8.Flexiblepoint configuration: Any point can be assigned as excitation or sampling
1. User management: Three-tier permission system (administrator/programmer/operator)
2. Project management: Categorized management for up to 1000 configuration items
3. Network point self-learning: Automatically identifies connection relationships between points
4.Test segment partitioning: Supports both auto-learned and manual segmentation
5. Graphical editing: Configure points directly on connector diagrams
6.Test parameter configuration: Customizable settings for OS testing, insulation testing, etc.
7.System self-diagnostics: Facilitates fault diagnosis
8.Multimeter function: Available for any port
9.High-speed point location with voice announcement(Optional audio)
10.PTC/NTC temperature conversion
11.Report printing & editing: Supports PDF and WORD formats
Product Application
Specification Category | Details | ||
Model | DP4000-M | ||
Measurement Method | Hybrid two/four-wire testing | ||
Maximum Test Points | 512 | ||
DC Output Voltage | 0V~1000V DC | ||
High Voltage Output Accuracy | ±3% | ||
High Voltage Measurement Accuracy | ±3% | ||
High Voltage Measurement Time | 0.1s~60s (excludes user delay) | ||
Low Voltage Measurement Time | 0.1s~60s (excludes user delay) | ||
OS Measurement Cycle | 500μs (1024 points, excludes user delay) | ||
Test Items and Range | Rapid Short/Open Test | 2kΩ~100kΩ | |
Internal 4-wire Continuity Resistance | 0.1Ω~1MΩ | ||
External 4-Wire ContinuityResistance | Test Range | 0.1mΩ~1MΩ | |
Test Current | ≤10mA | ||
DC Hipot Leakage Current | 0.1μA~5mA | ||
DC Hipot InsulationResistance | 1MΩ~1GΩ | ||
Diode/Zener Diode | Test Range | 0V~10V | |
Test Signal | 1mA/10V | ||
Short/Open Circuit Endpoint Identification | Supported | ||
Advanced Featrures | Programmable Continuous Test / Auto-Point Location / Auto Diagnostics | ||
Report Generation | WORD/PDF format report generation | ||
Storage Memory | Supports up to 1000 Test Configuration Files | ||
Control Panel | System/Quick/Edit/Function button groups | ||
Sorting Indication | Pass/Fail (LED/Display) | ||
Dimensions (mm) | 480(W) × 255(H) × 317(D) | ||
Maximum Weight (kg) | 15 | ||
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